Medical	Medical
Analytical	Zeta Potential Particle Size Molecular Weight Capillary Electrophoresis Spherulite diam./Corr. Length
Spectrometry	Spectrometer Thickness Measurement Light Measurement FPD Evaluation Material Evaluation In-Process Evaluation

Medical

Medical
Analytical

Zeta Potential

Particle Size

Molecular Weight

Capillary Electrophoresis

Spherulite diam./Corr. Length
Spectrometry
Spectrometer

Thickness Measurement
- Thickness Monitor
- Thickness Monitor FE-300
- Spectrum Ellipsometer FE-5000/5000S
- Built-in film thickness monitor　FE-3
- Optical Thickness Meter OPTM series
- Line-Scan Thickness Monitor ™ (In-line type)
- Line-Scan Thickness Monitor ™ (Off-line type)
- Si Wafer Thickness Monitor
- Si Wafer Thickness Monitoring System　SF-3
Light Measurement

FPD Evaluation

Material Evaluation
In-Process Evaluation
List of Product
Discontinued Products

Line-Scan Thickness Monitor ™ (In-line type) NEW

This in-line monitor can measure film thicknesses across the full-width and full-length of film products during manufacturing.
By combining our unique spectral interference technology with our newly developed high-precision film thickness processing technology, a single monitor can measure film thicknesses as wide as 500 mm in the shortest interval of 0.01 seconds

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Product
Specifications
Examples

Product

Features

Line scan method enables full-width and full-length film inspection without ` omission`
Original design of both hardware and software
As a manufacturer specializing in film thickness measurement, we can provide enriched support
High precision measurement is possible (patented)
High speed measurement is possible
Resistant to fluttering
Wide sample width (up to 10 m in the transverse direction)

Possible to install additional detectors to adjust to film width(MAX10m)
Instantaneous analysis of thickness data for 500 -mm -wide -film to enable full -width measurement

Specifications

Measurement item	Film thickness（FFT）
Spatial resolution	1 mm
Transverse width	500 mm
Wavelength width per element	Approx. 0.6 nm
Film thickness range	2 ～ 300 μm
Scan interval	10 msec ～

Examples

Measurement of PET film thickness

PET film becomes birefringent when stretched. The resulting spectral reflectance will become as shown in the figure. Our unique technology avoids the influence of this birefringence allowing for highly precise measurement.

The resulting spectral reflectance
Our unique technology avoids the influence of this birefringence allowing

In the case of 500 mm wide packaging film

Software

Product
Specifications
Examples

Related Information

Related Product

	Line-Scan Thickness Monitor ™ (Off-line type)
	Array Spectrometer MCPD-9800
	Optical Thickness Meter OPTM series
	Thickness Monitor FE-300
	Spectrum Ellipsometer FE-5000/5000S