Medical	Medical
Analytical	Zeta Potential Particle Size Molecular Weight Capillary Electrophoresis Spherulite diam./Corr. Length
Spectrometry	Spectrometer Thickness Measurement Light Measurement FPD Evaluation Material Evaluation In-Process Evaluation

Medical

Medical
Analytical

Zeta Potential

Particle Size

Molecular Weight

Capillary Electrophoresis

Spherulite diam./Corr. Length
Spectrometry
Spectrometer

Thickness Measurement

Light Measurement

FPD Evaluation

Material Evaluation
In-Process Evaluation
- Wafer manufacturing process
- Array Spectrometer MCPD-9800
- FPD evaluation process
- LCD Cell Gap Measurement RETS series
- Built-in film thickness monitor　FE-3
- Color Filter Spectral Inspection System LCF series
- Retardation Film Inspection System　RETS-100nx
- LED evaluation process
- High-speed LED Spectrometer LE series
- Wafer manufacturing process
- Si Wafer Thickness Monitoring System　SF-3
- Built-in film thickness monitor　FE-3
- Film formation process
- Si Wafer Thickness Monitoring System　SF-3
- Built-in film thickness monitor　FE-3
- High speed retardation measurement system　RE-200
- Retardation Film Inspection System　RETS-100nx
List of Product
Discontinued Products

Retardation Film Inspection System　RETS-100nx NEW

RETS-100nx is a retardation measuring system for all kinds of films such as OLED polarizing plate, laminated retardation film and polarizing plate with retardation film for IPS liquid crystal.
Extremely high retardation as 60,000 nm can be measured with high speed and high precision.
Lamination state of film can be measured "non-destructive without peeling".
Furthermore, on the operation, simple software and a correction function that copes with misalignment due to sample re-placement are installed. High-precision measurement can be easy to use.

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Product
Specifications
Optics

Product

Features

High-precision measurement due to our original spectrometer

■ High precision

　High precision achieved due to muti-wavelength measurement

　 [ Reason of high precision ]
　　　・Original High performance multi-channnel spectrophotometer is used.
　　　・High-precision measurement is possible, because a large amount of
　　　　transmittance information can be obtained.
　　　　(The obtained transmittance information is about 500 wavelengths,
　　　　about 50 times that of other companies' products)

■ Wide measurement range (Retardation range: 0 ～ 60,000 nm)

Wide measurement range (Retardation range: 0 ～ 60000 nm)

■ Wavelength dispersion of retardation can be obtained

Wavelength dispersion of retardation can be obtained

Extremely high retardation measurement -Super Retardation Film can be measured with high speed and high precision-

■ High retardation

Multi-layered film measurement -Lamination state of various films can be measured non-destructive without peeling-

Correction function for axis direction -Easy and reproducible measurement even if sample is misaligned-

■ Samples were replaced 10 times and the results were compared with and without axis correction
　　【 Sample：Retardation film R85 】

Sample were replaced 10 times and the results were compared with and without axis correction

Simple software -Measurement time and processing time are greatly reduced. Greatly improved operability-

Simple softwear　-Measurement time and processing time are greatly reduced. Greatly improved operability-

Specifications

Model	Retardation Film Inspection System RETS-100nx
Measurement items (film, optical material)	Retardation (wavelength dispersion), Slow axis, Rth^1, 3-D refractive index^1, etc.
Measurement items (polarizing plate)	Absorption axis, Polarization degree, Extinction ratio, Various chromaticities, Various transmittances, etc.
Measurement items (LCD cell)	Cell gap, Pre-tilt angle^*1,Twist angle, Alignment angle, etc.
Retardation measurement range	0 ～ 60,000 nm
Retardation repeatability	3σ ≦ 0.08 nm （quartz wave plate about 600 nm）
Cell gap measurement range	0 ～ 600 μm （when Δn=0.1）
Cell gap repeatability	3σ ≦ 0.005 μm （about 3 μm, when Δn=0.1）
Axis detect repeatability	3σ ≦ 0.08° （quartz wave plate about 600 nm）
Wavelenth range	400 ～ 800 nm （selectable other range）
Detector	High performance multi-channnel spectrophotometer
Measurement spot	φ2 mm （standard spec.）
Light source	100 W Halogen lamp
Data processing unit	PC, Monitor
Standard sample stage	100 mm × 100 mm （Fixed stage）
Options	・Extremely high retardation measurement ・Multi-layered film measurement ・Axis angular correction ・Automatic Cartesian stage ・Automatic tilt-rotation stage